Scientific Committee

  • Yves Aubry, IMATH/IML,  University of Toulon
  • Daniel Augot, LIX/INRIA,  Saclay.
  • Joan Daemen, STMicroelectronics, Belgium.
  • Benoit Feix, Inside Secure, France.
  • Laurent Imbert, LIRMM, Montpellier.
  • Marc Joye, Technicolor, France.
  • David Kohel, IML, University of Aix-Marseille
  • Philippe Langevin, IMATH,  University of Toulon
  • Gregor Leander, Technical  University of Denmark.
  • Reynald Lercier, DGA and University of Rennes.
  • Pierre-Yvan Liardet, STMicroelectronics, France.
  • Christiane Peters, Technical University of Denmark.
  • Pascal Veron,  IMATH,  University of Toulon.